首页> 外文期刊>Applied Physics Letters >4.8% efficient poly(3-hexylthiophene)-fullerene derivative (1:0.8) bulk heterojunction photovoltaic devices with plasma treated AgO_x/indium tin oxide anode modification
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4.8% efficient poly(3-hexylthiophene)-fullerene derivative (1:0.8) bulk heterojunction photovoltaic devices with plasma treated AgO_x/indium tin oxide anode modification

机译:等离子体处理的AgO_x /铟锡氧化物阳极改性的4.8%高效聚(3-己基噻吩)-富勒烯衍生物(1:0.8)本体异质结光伏器件

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摘要

We report here an improved efficiency, up to 4.8% with a high fill factor of ~63% under AM 1.5G spectral illumination and 100 mW/cm~2 intensity, for poly(3-hexylthiophene) and [6,6]-phenyl C_(61) butyric acid methyl ester bulk heterojunction photovoltaic (PV) devices with a 1:0.8 weight ratio using surface modifications to the indium tin oxide (ITO) anodes through plasma oxidized silver. Here, an enhanced short-circuit current density was achieved without significant loss in the open-circuit voltage (> 0.6V) nor the fill factor (> 63%), leading to an efficiency jump from 4.4% in the control devices to 4.8% with the surface modified ITO anode. The enhanced short-circuit density is attributed to an interface energy step between the ITO and the polymer hole transporting layer. It has been theorized that the introduction of an interface energy step could alter the charge collection efficiency, resulting in an improved overall efficiency in PV devices. In our study, the current density-voltage characteristics under darkness clearly show an increased current density, especially under forward bias, for the anode treated cell, suggesting the presence of an interface energy step between the ITO and the hole transporting layer with surface modified ITO anodes.
机译:我们在这里报告了聚(3-己基噻吩)和[6,6]-苯基在AM 1.5G光谱照明和100 mW / cm〜2强度下的效率提高到4.8%,填充因子高达〜63%。重量比为1:0.8的C_(61)丁酸甲酯本体异质结光伏(PV)装置,通过等离子体氧化银对铟锡氧化物(ITO)阳极进行表面改性。在此,在不显着降低开路电压(> 0.6V)或填充系数(> 63%)的情况下,实现了提高的短路电流密度,从而使效率从控制设备中的4.4%跃升至4.8%表面改性的ITO阳极。短路密度的提高归因于ITO和聚合物空穴传输层之间的界面能级。从理论上讲,引入界面能量步骤可以改变电荷收集效率,从而提高PV器件的整体效率。在我们的研究中,对于阳极处理过的电池,在黑暗中的电流密度-电压特性清楚地表明了电流密度的增加,尤其是在正向偏压下,这表明ITO和表面改性ITO的空穴传输层之间存在界面能阶跃阳极。

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