首页> 外文期刊>Applied Physicsletters >Simultaneous in-plane and out-of-plane exchange bias using a single antiferromagnetic layer resolved by x-ray magnetic circular dichroism
【24h】

Simultaneous in-plane and out-of-plane exchange bias using a single antiferromagnetic layer resolved by x-ray magnetic circular dichroism

机译:使用单个反铁磁层通过X射线磁性圆二色性同时解决面内和面外交换偏置

获取原文
获取原文并翻译 | 示例
       

摘要

We present a study of exchange bias in ferromagnet/antiferromagnet/ferromagnet (FM/AFM/FM) trilayers, with in-plane and out-plane easy axes. Using element-specific x-ray magnetic circular dichroism, we demonstrate that simultaneous in-plane and out-of-plane exchange bias can be induced using a single antiferromagnet and zero field cooling, whereas field cooling only induces exchange bias to the layer with easy axis parallel to the cooling field. Our results further evidence the presence of pinned uncompensated moments in both the FM and AFM layers, implying that the AFM layer is capable of supporting uncompensated spins in two orthogonal directions at the same time.
机译:我们提出了在铁磁体/反铁磁体/铁磁体(FM / AFM / FM)三层中具有平面内和平面外易轴的交换偏置的研究。使用特定于元素的X射线磁性圆二色性,我们证明了使用单个反铁磁体和零磁场冷却可以同时引起面内和面外交换偏置,而场冷却仅会导致层间容易产生交换偏置轴平行于冷却场。我们的结果进一步证明了FM和AFM层中都存在未补偿的固定力矩,这表明AFM层能够同时支持两个正交方向上的未补偿自旋。

著录项

  • 来源
    《Applied Physicsletters》 |2009年第15期|152515.1-152515.3|共3页
  • 作者单位

    Centre d'Investigacio en Nanociencia i Nanotecnologia (ICN-CSIC), Campus Universitat Autonoma de Barcelona, E-08193 Bellaterra, SpainrnInstitucio Catalana de Recerca i Estudis Avancats (ICREA), E-08010 Barcelona, Spain;

    Centre d'Investigacio en Nanociencia i Nanotecnologia (ICN-CSIC), Campus Universitat Autonoma de Barcelona, E-08193 Bellaterra, Spain;

    Department of Energy, CIEMAT, Avda. Complutense 22, E-28040 Madrid, Spain;

    Institucio Catalana de Recerca i Estudis Avancats (ICREA), E-08010 Barcelona, Spain Departament de Fisica, Universitat Autonoma de Barcelona, E-08193 Bellaterra, Spain;

    SPINTEC (URA CNRS/CEA 2512), CEA-Grenoble, 17 Av. des Martyrs, F-38054 Grenoble Cedex 9, France;

    Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland;

    Centre d'Investigacio en Nanociencia i Nanotecnologia (ICN-CSIC), Campus Universitat Autonoma de Barcelona, E-08193 Bellaterra, Spain Institucio Catalana de Recerca i Estudis Avancats (ICREA), E-08010 Barcelona, Spain;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 03:20:00

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号