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Extraction of semiconductor microchip differential gain by use of optically pumped semiconductor laser

机译:利用光泵浦半导体激光器提取半导体微分增益

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摘要

The small-signal modulation response of a vertical external cavity surface emitting laser is analyzed to determine its resonance frequency in relation to photon density, allowing nondestructive extraction of characteristic parameters of chips, such as internal loss and differential gain.
机译:分析垂直外腔表面发射激光器的小信号调制响应,以确定其与光子密度有关的共振频率,从而可以无损提取芯片的特征参数,例如内部损耗和差分增益。

著录项

  • 来源
    《Applied Physicsletters》 |2009年第11期|111101.1-111101.3|共3页
  • 作者单位

    Air Force Research Laboratory Sensors Directorate, Wright-Paiterson AFB, Ohio 45433-7321, USA;

    Air Force Research Laboratory Sensors Directorate, Wright-Paiterson AFB, Ohio 45433-7321, USA;

    Air Force Research Laboratory Sensors Directorate, Wright-Paiterson AFB, Ohio 45433-7321, USA Nonlinear Control Strategics, Tucson, AZ, USA;

    Air Force Research Laboratory Sensors Directorate, Wright-Paiterson AFB, Ohio 45433-7321, USA Nonlinear Control Strategics, Tucson, AZ, USA;

    Air Force Research Laboratory Sensors Directorate, Wright-Paiterson AFB, Ohio 45433-7321, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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