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Effects of rf-bias power on plasma parameters in a low gas pressure inductively coupled plasma

机译:射频偏压功率对低气压感应耦合等离子体中等离子体参数的影响

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摘要

Remarkable changes of the electron temperature and the plasma density by increasing bias power were observed in low gas pressure inductively coupled plasma (ICP) by the measurement of electron energy distribution function (EEDF). As the bias power increases, the electron temperature increased with accompanying the evolution of the EEDF from a bi-Maxwellian to a Maxwellian distribution. However, a different trend of the plasma density was observed with a dependence on the ICP powers. When the ICP power was relatively small or the discharge is in capacitive mode (E mode), the plasma density increased considerably with the bias power, while decrease of the plasma density was observed when the discharge is in inductive mode (H mode). The change of the plasma density can be explained by the balance between total power absorption and power dissipation.
机译:在低气压感应耦合等离子体(ICP)中,通过测量电子能量分布函数(EEDF),观察到电子温度和等离子体密度由于偏置功率的增加而发生了显着变化。随着偏置功率的增加,电子温度也随着EEDF从双麦克斯韦分布向麦克斯韦分布的发展而上升。但是,观察到等离子体密度的变化趋势取决于ICP功率。当ICP功率相对较小或放电处于电容模式(E模式)时,等离子体密度随偏置功率而显着增加,而当放电处于电感模式(H模式)时,等离子体密度降低。等离子体密度的变化可以通过总功率吸收和功率消耗之间的平衡来解释。

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  • 来源
    《Applied Physicsletters》 |2010年第7期|071501.1-071501.3|共3页
  • 作者单位

    Department of Electrical Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea;

    Department of Electrical Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea;

    Department of Electrical Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791, Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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