机译:V / III流量比对掺Er GaN发光性能和缺陷形成的影响
Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;
Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;
Research Institute for Computational Sciences, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan;
Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;
Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;
Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;
机译:V / III流量比对掺Er GaN发光性能和缺陷形成的影响
机译:掺Er的GaN中缺陷与光学性质的关系
机译:不同V / III比率下氢化物气相外延GaN膜缺陷的比较及对电和光学性质的影响
机译:mBE对(0001)蓝宝石生长GaN缓冲层中N / Ga流量比对GaN主层中缺陷形成的影响
机译:GaN中点缺陷的时间分辨光致发光研究。
机译:MAPT / TAU积累通过破坏IST1调节的ESCRT-III复杂形成来抑制自噬助焊剂:Alzheimer神经变性的恶性循环
机译:掺杂Er的GaN中Er相关发光的浓度猝灭的抑制
机译:III-V超晶格相互扩散的低能量阴极发光光谱研究:扩散相关缺陷的光学发射特性