Precise, real-time, single-shot carrier-envelope phase measurement in the multi-cycle regime

摘要

Polarization gating is used to extend a real-time, single-shot, carrier-envelope phase (CEP) measurement, based on high-energy above-threshold ionization in xenon, to the multi-cycle regime. The single-shot CEP precisions achieved are better than 175 and 350 mrad for pulse durations up to 10 fs and 12.5 fs, respectively, while only 130 μJ of pulse energy are required. This opens the door to study and control of CEP-dependent phenomena in ultra-intense laser-matter interaction using optical parametric chirped pulse amplifier based tera- and petawatt class lasers.