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Controlled growth of epitaxial BiFeO_3 films using self-assembled BiFeO_3-CoFe_2O_4 multiferroic heterostructures as a template

机译:以自组装的BiFeO_3-CoFe_2O_4多铁性异质结构为模板,控制外延BiFeO_3薄膜的生长

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摘要

The growth mechanism of a BiFeO_3 layer deposited on self assembled (0.65) BiFeO_3-(0.35) CoFe_2O_4 (BFO-CFO) composite thin films was studied. Epitaxial and self-assembled BFO-CFO thin films were deposited on SrTiO_3 (111) substrates by pulsed laser deposition and were subsequently used as a seed layer for the deposition of an additional BFO layer, x-ray line scans showed the heterostructures were highly epitaxial. Cross-sectional scanning electron microscopy and focused ion beam images revealed the top BFO layer grew preferentially from BFO nanopillars in the BFO-CFO thin films, thus, demonstrating controlled growth. The multiferroic properties of this new nanostructure were then studied.
机译:研究了自组装(0.65)BiFeO_3-(0.35)CoFe_2O_4(BFO-CFO)复合薄膜上沉积的BiFeO_3层的生长机理。通过脉冲激光沉积将外延和自组装的BFO-CFO薄膜沉积在SrTiO_3(111)衬底上,随后用作种子层以沉积额外的BFO层,X射线线扫描表明异质结构是高度外延的。横截面扫描电子显微镜和聚焦离子束图像显示,顶部BFO层优先从BFO-CFO薄膜中的BFO纳米柱生长,因此证明了生长受控。然后研究了这种新的纳米结构的多铁性。

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  • 来源
    《Applied Physics Letters》 |2012年第2期|p.022905.1-022905.5|共5页
  • 作者单位

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Multi-Disciplinary Materials Research Center, Frontier Institute of Science and Technology,Xi'an Jiaotong University, Xi'an 710054, China;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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