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Temperature-dependent carrier-phonon coupling in topological insulator Bi_2Se_3

机译:拓扑绝缘体Bi_2Se_3中温度相关的载流子-声子耦合

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摘要

Temperature-dependent (11.0 K-294.5 K) carrier-phonon coupling in Bi_2Se_3 is investigated by ultrafast pump-probe spectroscopy. The rise time of the differential reflectivity is interpreted by a combined effect of electron temperature relaxation and hot-phonon lifetime. The electron-phonon coupling constant of the bulk state (λ = 0.63±0.05) is deduced from theoretical fitting. Increasing hot-phonon lifetime with decreasing temperature is attributed to a decreasing phonon-phonon collision rate. A complete analysis of the thermalization process is presented. Understanding carrier and phonon dynamics is essential for future optoelectronic and spintronic applications of topological insulators.
机译:通过超快泵浦探针光谱研究了Bi_2Se_3中依赖温度的(11.0 K-294.5 K)载子-声子耦合。电子温度弛豫和热声子寿命的综合作用解释了差分反射率的上升时间。根据理论拟合推导了体态的电子-声子耦合常数(λ= 0.63±0.05)。随着温度降低,热声子寿命增加归因于声子-声子碰撞速率的降低。介绍了对热化过程的完整分析。了解载流子和声子动力学对于拓扑绝缘子的未来光电和自旋电子学应用至关重要。

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  • 来源
    《Applied Physics Letters 》 |2014年第23期| 232110.1-232110.5| 共5页
  • 作者单位

    Electrical Engineering Department, University of California Los Angeles, Los Angeles, California 90095,USA;

    Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan;

    Department of Electrophysics, National Chiao-Tung University, Hsinchu 300, Taiwan;

    Electrical Engineering Department, University of California Los Angeles, Los Angeles, California 90095,USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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