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机译:低电阻率C54-TiSi_2作为三维垂直电阻存储器的侧壁约束纳米级电极
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Kingdom of Saudi Arabia,Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan;
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Kingdom of Saudi Arabia,Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan;
Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan;
Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan;
Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan;
Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA;
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Kingdom of Saudi Arabia;
机译:低电阻率C54-TiSi
机译:纳米级电阻式存储设备中的导电丝的三维观察
机译:由NiO纳米点和石墨烯纳米带纳米隙电极组成的纳米级电阻开关存储器件
机译:高分辨率透射电镜研究增强低电阻率C54-TiSi_2的形成
机译:低电阻率的锗硅化物接触层形成了用于纳米级CMOS的磷掺杂的硅锗合金源/漏结。
机译:子NM厚电极垂直电阻存储器的电磁分析
机译:低电阻率C54-TiSi2作为三维垂直电阻存储器的侧壁约束纳米级电极