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Multicolor and near-infrared electroluminescence from the light-emitting devices with rare-earth doped TiO_2 films

机译:稀土掺杂TiO_2薄膜的发光器件的多色和近红外电致发光

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摘要

We report on multicolor and near-infrared electroluminescence (EL) from the devices using rare-earth doped TiO_2 (TiO_2:RE) films as light-emitting layers, which are ascribed to the impact excitation of RE~(3+) ions, with the EL onset voltages below 10 V. The devices are in the structure of ITO/ TiO_2:RE/SiO_2/Si, in which the SiO_2 layer is ~10nm thick and RE includes Eu, Er, Tm, Nd, and so on. With sufficiently high positive voltage applied on the ITO electrode, the conduction electrons in Si can tunnel into the conduction band of SiO_2 layer via the trap-assisted tunneling mechanism, gaining the potential energy ~4 eV higher than the conduction band edge of TiO_2. Therefore, as the electrons in the SiO_2 layer drift into the TiO_2:RE layer, they become hot electrons. Such hot electrons impact-excite the RE~(3+) ions incorporated into the TiO_2 host, leading to the characteristic emissions.
机译:我们报道了使用稀土掺杂的TiO_2(TiO_2:RE)薄膜作为发光层的器件的多色和近红外电致发光(EL),这归因于RE〜(3+)离子的冲击激发, EL起始电压低于10V。该器件采用ITO / TiO_2:RE / SiO_2 / Si的结构,其中SiO_2层的厚度约为10nm,RE包括Eu,Er,Tm,Nd等。通过在ITO电极上施加足够高的正电压,Si中的导电电子可以通过陷阱辅助隧穿机制隧穿到SiO_2层的导带中,从而获得比TiO_2导带边缘高约4 eV的势能。因此,随着SiO_2层中的电子漂移到TiO_2:RE层中,它们成为热电子。这种热电子冲击激发掺入TiO_2基质中的RE〜(3+)离子,从而导致特征发射。

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  • 来源
    《Applied Physics Letters》 |2015年第13期|131103.1-131103.5|共5页
  • 作者单位

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China,Department of Chemistry, Huzhou University, Huzhou 313000, Zhejiang, People's Republic of China;

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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