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Third-order intermodulation distortion in graphene resonant channel transistors

机译:石墨烯谐振沟道晶体管中的三阶互调失真

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摘要

Third-order intermodulation distortion (IM3) is an important metric for electromechanical resonators used in radio frequency signal processing applications since it characterizes the nonlinearity of the device, and the amount of in-band interference it generates when subject to unwanted, out-of-band signals. In this letter, we measure and model IM3 in a strain-engineered graphene mechanical resonator operated as a graphene resonant channel transistor (G-RCT). The device analyzed in this work has a voltage third-order intercept point (V_(IIP3)) of 69.5 dBm V at a gate-to-source DC bias (V_(gs)) of 2.5 V, which drops to 52.1 dBm V at V_(gs) = 4.5 V when driven with two out-of-band input tones spaced 5 and 10 MHz from the resonant frequency. The decrease in the V_(IIP3) with V_(gs) coincides with an increase in the transmission response (S_(21)) of the device, illustrating a trade-off between transduction efficiency and linearity. In addition, we find that conventional micro-electro-mechanical systems theory for IM3 calculation does not accurately describe our measurement data. To resolve this discrepancy, we develop a model for IM3 in G-RCTs that takes into account all of the output current terms present in the embedded transistor structure, as well as an effective Duffing parameter (α_(eff)).
机译:三阶互调失真(IM3)是射频信号处理应用中使用的机电谐振器的一项重要指标,因为它表征了设备的非线性特性,以及当设备遭受不必要的干扰时所产生的带内干扰量。频段信号。在这封信中,我们在作为石墨烯谐振沟道晶体管(G-RCT)的应变工程石墨烯机械谐振器中测量和建模IM3。在这项工作中分析的器件在2.5V的栅源DC偏置(V_(gs))时具有69.5 dBm V的电压三阶交调点(V_(IIP3)),在2.5V时下降至52.1 dBm V当以两个带外输入音调驱动时,V_(gs)= 4.5 V,相距谐振频率5和10 MHz。 V_(IIP3)随V_(gs)的减少与设备传输响应(S_(21))的增加相吻合,说明了转换效率和线性之间的权衡。此外,我们发现用于IM3计算的常规微机电系统理论不能准确地描述我们的测量数据。为了解决这一差异,我们针对G-RCT中的IM3开发了一个模型,该模型考虑了嵌入式晶体管结构中存在的所有输出电流项以及有效的Duffing参数(α_(eff))。

著录项

  • 来源
    《Applied Physics Letters》 |2015年第7期|073504.1-073504.5|共5页
  • 作者单位

    Department of Electrical Engineering, Columbia University, New York, New York 10027, USA;

    Department of Electrical Engineering, Columbia University, New York, New York 10027, USA;

    Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA;

    Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA;

    Department of Electrical Engineering, Columbia University, New York, New York 10027, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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