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Solid phase epitaxial growth of high mobility La:BaSnO_3 thin films co-doped with interstitial hydrogen

机译:间隙氢共掺杂高迁移率La:BaSnO_3薄膜的固相外延生长

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摘要

This work presents the solid phase epitaxial growth of high mobility La:BaSnO_3 thin films on SrTiO_3 single crystal substrates by crystallization through thermal annealing of nanocrystalline thin films prepared by pulsed laser deposition at room temperature. The La:BaSnO_3 thin films show high epitaxial quality and Hall mobilities up to 26 ± 1 cm~2/Vs. Secondary ion mass spectroscopy is used to determine the La concentration profile in the La:BaSnO_3 thin films, and a 9%-16% La doping activation efficiency is obtained. An investigation of H doping to BaSnO_3 thin films is presented employing H plasma treatment at room temperature. Carrier concentrations in previously insulating BaSnO_3 thin films were increased to 3 × 10~(19)cm~(-3) and in La:BaSnO_3 thin films from 6 × 10~(19)cm~(-3) to 1.5 × 10 cm~(-3), supporting a theoretical prediction that interstitial H serves as an excellent n-type dopant. An analysis of the free electron absorption by infrared spectroscopy yields a small (H,La):BaSnO_3 electron effective mass of 0.27 ± 0.05 m_0 and an optical mobility of 26 ± 7 cm~2/Vs. As compared to La:BaSnO_3 single crystals, the smaller electron mobility in epitaxial thin films grown on SrTiO_3 substrates is ascribed to threading dislocations as observed in high resolution transmission electron micrographs.
机译:这项工作提出了SrTiO_3单晶衬底上高迁移率的La:BaSnO_3薄膜的固相外延生长,该过程是通过在室温下通过脉冲激光沉积制备的纳米晶体薄膜的热退火而结晶的。 La:BaSnO_3薄膜具有很高的外延质量,霍尔迁移率高达26±1 cm〜2 / Vs。二次离子质谱法用于确定La:BaSnO_3薄膜中的La浓度分布,获得9%-16%的La掺杂活化效率。提出了在室温下采用H等离子体处理对BaSnO_3薄膜进行H掺杂的研究。先前绝缘的BaSnO_3薄膜的载流子浓度增加到3×10〜(19)cm〜(-3),La:BaSnO_3薄膜的载流子浓度从6×10〜(19)cm〜(-3)增加到1.5×10 cm 〜(-3),支持理论上的预测,即间隙H可作为一种出色的n型掺杂剂。通过红外光谱分析自由电子吸收产生的小(H,La):BaSnO_3电子有效质量为0.27±0.05 m_0,光学迁移率为26±7 cm〜2 / Vs。与La:BaSnO_3单晶相比,生长在SrTiO_3衬底上的外延薄膜中较小的电子迁移率归因于高分辨透射电子显微图中观察到的穿线位错。

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  • 来源
    《Applied Physics Letters》 |2016年第17期|172101.1-172101.5|共5页
  • 作者单位

    Department of Materials, Imperial College London, Exhibition Road, London SW7 2AZ, United Kingdom,Materials and Structures Laboratory, Tokyo Institute of Technology, Mailbox R3-4, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;

    Department of Materials, Imperial College London, Exhibition Road, London SW7 2AZ, United Kingdom;

    Department of Materials, Imperial College London, Exhibition Road, London SW7 2AZ, United Kingdom;

    Materials and Structures Laboratory, Tokyo Institute of Technology, Mailbox R3-4, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;

    Department of Materials, Imperial College London, Exhibition Road, London SW7 2AZ, United Kingdom;

    Materials and Structures Laboratory, Tokyo Institute of Technology, Mailbox R3-4, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;

    Materials and Structures Laboratory, Tokyo Institute of Technology, Mailbox R3-4, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;

    Materials and Structures Laboratory, Tokyo Institute of Technology, Mailbox R3-4, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan,Materials Research Center for Element Strategy, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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