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Three-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO_2(110)

机译:金红石型TiO_2(110)上点缺陷的三维相互作用力和隧道电流谱

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摘要

The extent to which point defects affect the local chemical reactivity and electronic properties of an oxide surface was evaluated with picometer resolution in all three spatial dimensions using simultaneous atomic force/scanning tunneling microscopy measurements performed on the (110) face of rutile TiO_2. Oxygen atoms were imaged as protrusions in both data channels, corresponding to a rarely observed imaging mode for this prototypical metal oxide surface. Three-dimensional spectroscopy of interaction forces and tunneling currents was performed on individual surface and subsurface defects as a function of tip-sample distance. An interstitial defect assigned to a subsurface hydrogen atom is found to have a distinct effect on the local density of electronic states on the surface, but no detectable influence on the tip-sample interaction force. Meanwhile, spectroscopic data acquired on an oxygen vacancy highlight the role of the probe tip in chemical reactivity measurements.
机译:使用在金红石TiO_2的(110)面上同时进行的原子力/扫描隧道显微镜测量,在所有三个空间维度上使用皮分表分辨率评估点缺陷影响氧化物表面的局部化学反应性和电子性能的程度。氧原子被成像为两个数据通道中的突起,对应于此原型金属氧化物表面很少见到的成像模式。根据尖端样本距离对各个表面和亚表面缺陷进行了相互作用力和隧穿电流的三维光谱分析。发现分配给地下氢原子的间隙缺陷对表面上电子态的局部密度有明显影响,但对尖端样品相互作用力没有可检测的影响。同时,在氧空位上获得的光谱数据突出了探针在化学反应性测量中的作用。

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  • 来源
    《Applied Physics Letters》 |2016年第7期|071601.1-071601.5|共5页
  • 作者单位

    Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA,Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, Connecticut 06520, USA,Department of Mechanical Engineering and UNAM-Institute of Materials Science and Nanotechnology, Bilkent University, Ankara 06800, Turkey;

    Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA,Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, Connecticut 06520, USA,Department of Chemical and Environmental Engineering, Yale University, New Haven, Connecticut 06520, USA,Institute of Physics and Center for Nanotechnology (CeNTech), University of Muenster, Muenster 48149, Germany;

    Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA,Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, Connecticut 06520, USA,Department of Chemical and Environmental Engineering, Yale University, New Haven, Connecticut 06520, USA,Physics Department, Southern Connecticut State University, New Haven, Connecticut 06515, USA;

    Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA,Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, Connecticut 06520, USA,Department of Electrical and Electronics Engineering, Yasar University, Izmir 35100, Turkey;

    Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, Connecticut 06520, USA,Department of Chemical and Environmental Engineering, Yale University, New Haven, Connecticut 06520, USA;

    Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA,Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, Connecticut 06520, USA,Department of Chemical and Environmental Engineering, Yale University, New Haven, Connecticut 06520, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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