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Stability of the spectral responsivity of cryogenically cooled InSb infrared detectors

机译:低温冷却的InSb红外探测器的光谱响应稳定性

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摘要

The spectral responsivity of two cryogenically cooled InSb detectors was observed to drift slowly with time. The origin of these drifts was investigated and was shown to occur due to a water-ice thin film that was deposited onto the active areas of the cold detectors. The presence of the ice film (which is itself a dielectric film) modifies the transmission characteristics of the antireflection coatings deposited on the active areas of the detectors, thus giving rise to the observed drifts. The magnitude of the drifts was drastically reduced by evacuating the detector dewars while baking them at 50 deg C for approximately 48 h. All InSb detectors have antireflection coatings to reduce the Fresnel reflections and therefore enhance their spectral responsivity. This work demonstrates that InSb infrared detectors should be evacuated and baked at least annually and in some cases (depending on the quality of the dewar and the measurement uncertainty required) more frequently. These observations are particularly relevant to InSb detectors mounted in dewars that use rubber O rings since the ingress of moisture was found to be particularly serious in this type of dewar.
机译:观察到两个低温冷却的InSb检测器的光谱响应随时间缓慢漂移。对这些漂移的起源进行了研究,结果表明这是由于冰冰薄膜沉积在冷探测器的有效区域上而引起的。冰膜(本身是介电膜)的存在改变了沉积在检测器有效区域上的抗反射涂层的透射特性,从而引起了观察到的漂移。通过将探测器杜瓦瓶抽真空,同时在50摄氏度下烘烤48小时,可以大大降低漂移的幅度。所有InSb检测器均具有减反射涂层,以减少菲涅耳反射,从而增强其光谱响应度。这项工作表明,InSb红外探测器应至少每年一次抽空并烘烤,在某些情况下(取决于杜瓦瓶的质量和所需的测量不确定性)。这些发现与安装在使用橡胶O形环的杜瓦瓶中的InSb探测器特别相关,因为发现在这种杜瓦瓶中水分的侵入特别严重。

著录项

  • 来源
    《Applied Optics》 |2005年第29期|p.6087-6092|共6页
  • 作者

    Evangelos Theocharous;

  • 作者单位

    Optical Radiation Team, Quality of Life Division, National Physical Laboratory, Middlesex TW 11 OLW, United Kingdom;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 光学;
  • 关键词

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