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Enhancement in electrical performance of thin-film silicon solar cells based on a micro- and nano-textured zinc oxide electrodes

机译:基于微米和纳米结构的氧化锌电极的薄膜硅太阳能电池的电性能增强

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摘要

Boron-doped ZnO (BZO) films deposited by metal organic chemical vapor deposition (MOCVD) generally act as transparent conductive oxide films in hydrogenated amorphous silicon (a-Si:H) solar cells and exhibit a high external quantum efficiency (EQE) performance in the short-wavelength region. They, therefore, facilitate efficient use of sunlight in solar cells. However, sharp surface features on the BZO film may result in nano-cracks and voids in the cells. In this study, we devised a process for modifying these sharp features. The BZO films were smoothened by performing a sputtering hydrogen-doped ZnO (HZO) layer using a magnetron sputtering system. The a-Si:H solar cells based on BZO films subjected to this treatment exhibited a higher open-circuit voltage (V_(oc)), fill factor (FF), and efficiency; however, their short-circuit current density (J_(sc)) decreased slightly. In an attempt to increase the J_(sc) while maintaining a high electrical performance for the solar cells, we deposited an additional thin BZO film on the sputter-treated one to realize a micro- and nano-textured structure. This strategy succeeded in increasing J_(sc) and also caused a further improvement in the V_(oc), FF, and efficiency. As a result, over 10% efficiency of a-Si:H solar cells based on BZO electrodes with a micro- and nano-textured structure was achieved. Moreover, the thickness of the cell is only 300 nm.
机译:通过金属有机化学气相沉积(MOCVD)沉积的掺硼ZnO(BZO)膜通常在氢化非晶硅(a-Si:H)太阳能电池中充当透明导电氧化物膜,并在硅中显示出高的外部量子效率(EQE)性能。短波长区域。因此,它们有助于有效利用太阳能电池中的阳光。但是,BZO膜上的锋利表面特征可能会导致单元中出现纳米裂纹和空隙。在这项研究中,我们设计了一种修改这些尖锐特征的方法。通过使用磁控溅射系统执行溅射氢掺杂ZnO(HZO)层来使BZO膜光滑。经过BZO膜处理的a-Si:H太阳能电池具有较高的开路电压(V_(oc)),填充系数(FF)和效率;然而,它们的短路电流密度(J_(sc))略有下降。为了在提高J_(sc)的同时保持太阳能电池的高电性能,我们在溅射处理过的薄膜上沉积了一层额外的BZO薄膜,以实现微结构和纳米结构。该策略成功地增加了J_(sc),并且还导致了V_(oc),FF和效率的进一步提高。结果,基于具有微结构和纳米结构的BZO电极的a-Si:H太阳能电池的效率达到了10%以上。而且,单元的厚度仅为300nm。

著录项

  • 来源
    《Applied Energy》 |2014年第15期|158-164|共7页
  • 作者单位

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

    Institute of Photo Electronic Thin Film Devices and Technology of Nankai University, Key Laboratory of Photoelectronic Thin Film Devices and Technology, Tianjin 300071, PR China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    MOCVD-BZO; Micro- and nano-textured structure; Sputtering hydrogen-doped ZnO (HZO); a-Si:H solar cell;

    机译:MOCVD-BZO;微结构和纳米结构;溅射氢掺杂的ZnO(HZO);a-Si:H太阳能电池;

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