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R&D intensity, firm performance and the identification of the threshold: fresh evidence from the panel threshold regression model

机译:研发强度,企业绩效和阈值识别:面板阈值回归模型的最新证据

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摘要

This article tests whether there is an optimal level of research and development (R&D) intensity at which point a firm is able to maximize its performance. An advanced panel threshold regression model is employed to investigate the panel threshold effect of R&D intensity on firm performance among publicly traded Taiwan information technology and electronic firms. The results confirm that a single-threshold effect does exist and show an inverted-U correlation between R&D intensity and firm performance. This article demonstrates that it is possible to identify the definitive level beyond which a further increase in R&D expenditure does not yield proportional rewards. Some important policy implications emerge from the findings.
机译:本文测试了是否存在最佳的研发(R&D)强度水平,此时企业能够最大化其绩效。采用先进的面板阈值回归模型研究台湾信息技术和电子公司的研发强度对企业绩效的面板阈值影响。结果证实确实存在单阈值效应,并且显示了R&D强度与公司绩效之间的倒U相关性。本文表明,有可能确定最终的水平,超过此水平,研发支出的进一步增加不会产生成比例的回报。调查结果显示出一些重要的政策含义。

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  • 来源
    《Applied Economics》 |2010年第3期|P.389-401|共13页
  • 作者单位

    Department of Business Administration, National Chung Hsing University, Taichung, Taiwan;

    Department of Business Administration, National Chung Hsing University, Taichung, Taiwan Department of Business Administration, Ling Tung University, Taichung, Taiwan;

    Department of International Business Studies, National Chi Nan University, Nantou, Taiwan;

    Department of Business Administration, National Chung Hsing University, Taichung, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);
  • 原文格式 PDF
  • 正文语种 eng
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