...
首页> 外文期刊>American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the >The recognition of possible measurement errors in D-C dielectric testing in the field
【24h】

The recognition of possible measurement errors in D-C dielectric testing in the field

机译:在现场进行D-C介电测试中可能出现的测量误差的识别

获取原文
获取原文并翻译 | 示例
           

摘要

IN RECENT years, a definite trend appears to have developed, toward d-c testing of insulation. The reasons or this trend are as follows: 1. The d-c test set required is much more portable than an equivalent a-c test set and power requirements are much less. 2. High-voltage d-c tests are less destructive than equivalent a-c tests, as evidenced by the much flatter voltage-time endurance curve in the case of direct current. 3. From the d-c tests important information may be obtained which is related to the condition of the insulation. Periodic tests make it possible to follow the insulation deterioration and thereby aid in determining the need of reconditioning steps and estimating life expectancy.
机译:在最近的几年中,朝着绝缘的d-c测试发展了一个明确的趋势。原因或这种趋势如下:1.所需的d-c测试仪比等效的a-c测试仪具有更高的便携性,而电源要求却少得多。 2.高压d-c测试的破坏力不及等效的a-c测试,这在直流电情况下的电压时间耐久曲线要平坦得多。 3.从d-c测试中可以获得与绝缘状况有关的重要信息。定期测试可以跟踪绝缘的劣化情况,从而有助于确定是否需要进行修复步骤并估算预期寿命。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号