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An Improved Approach for Reduction of Defect Density Using Optimal Module Sizes

机译:一种使用最佳模块尺寸减少缺陷密度的改进方法

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摘要

Nowadays, software developers are facing challenges in minimizing the number of defects during the software development. Using defect density parameter, developers can identify the possibilities of improvements in the product. Since the total number of defects depends on module size, so there is need to calculate the optimal size of the module to minimize the defect density. In this paper, an improved model has been formulated that indicates the relationship between defect density and variable size of modules. This relationship could be used for optimization of overall defect density using an effective distribution of modules sizes. Three available data sets related to concern aspect have been examined with the proposed model by taking the distinct values of variables and parameter by putting some constraint on parameters. Curve fitting method has been used to obtain the size of module with minimum defect density. Goodness of fit measures has been performed to validate the proposed model for data sets. The defect density can be optimized by effective distribution of size of modules. The larger modules can be broken into smaller modules and smaller modules can be merged to minimize the overall defect density.
机译:如今,软件开发人员在最小化软件开发过程中的缺陷数量方面面临着挑战。使用缺陷密度参数,开发人员可以确定产品改进的可能性。由于缺陷的总数取决于模块的尺寸,因此需要计算模块的最佳尺寸以最小化缺陷密度。在本文中,提出了一种改进的模型,该模型指示了缺陷密度和模块可变尺寸之间的关系。这种关系可以通过有效分配模块尺寸来用于优化总体缺陷密度。提出的模型通过考虑变量和参数的不同值,并对参数施加一些约束,研究了与关注方面有关的三个可用数据集。曲线拟合法已被用于以最小的缺陷密度获得模块的尺寸。已执行拟合度度量以验证所提出的数据集模型。可以通过有效分配模块尺寸来优化缺陷密度。较大的模块可以分为较小的模块,较小的模块可以合并以最小化总体缺陷密度。

著录项

  • 来源
    《Advances in software engineering》 |2014年第2014期|803530.1-803530.7|共7页
  • 作者

    Dinesh Verma; Shishir Kumar;

  • 作者单位

    Department of Computer Science & Engineering, Jaypee University of Engineering and Technology, Guna, India;

    Department of Computer Science & Engineering, Jaypee University of Engineering and Technology, Guna, India;

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  • 正文语种 eng
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