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Controlled Nucleation of GaN Nanowires Grown with Molecular Beam Epitaxy

机译:分子束外延生长的GaN纳米线的受控成核

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摘要

The location of GaN nanowires is controlled with essentially perfect selectivity using patterned SiN_x prior to molecular beam epitaxy growth. Nanowire growth is uniform within mask openings and absent on the mask surface for over 95% of the usable area of a 76 mm diameter substrate. The diameters of the resulting nanowires are controlled by the size of the mask openings. Openings of approximately 500 nm or less produce single nanowires with symmetrically faceted tips.
机译:在分子束外延生长之前,使用图案化的SiN_x以基本完美的选择性控制GaN纳米线的位置。纳米线的生长在掩模开口内是均匀的,并且在掩模表面上不存在,其直径超过76毫米直径基板可用面积的95%以上。所得纳米线的直径由掩模开口的尺寸控制。大约500 nm或更小的开口产生具有对称刻面尖端的单纳米线。

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  • 来源
    《Advanced Functional Materials 》 |2010年第17期| P.2911-2915| 共5页
  • 作者单位

    NIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

    rnNIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

    rnNIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

    rnNIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

    rnNIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

    rnNIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

    rnNIST, Mail Stop 815.04 325 Broadway, Boulder, CO 80305 (USA);

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