首页> 外文期刊>Advanced Functional Materials >Exploring the Leidenfrost Effect for the Deposition of High-Quality In2O3 Layers via Spray Pyrolysis at Low Temperatures and Their Application in High Electron Mobility Transistors
【24h】

Exploring the Leidenfrost Effect for the Deposition of High-Quality In2O3 Layers via Spray Pyrolysis at Low Temperatures and Their Application in High Electron Mobility Transistors

机译:低温喷雾热解沉积高质量In2O3层的莱顿弗罗斯特效应及其在高电子迁移率晶体管中的应用

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The growth mechanism of indium oxide (In2O3) layers processed via spray pyrolysis of an aqueous precursor solution in the temperature range of 100-300 degrees C and the impact on their electron transporting properties are studied. Analysis of the droplet impingement sites on the substrate's surface as a function of its temperature reveals that Leidenfrost effect dominated boiling plays a crucial role in the growth of smooth, continuous, and highly crystalline In2O3 layers via a vapor phase-like process. By careful optimization of the precursor formulation, deposition conditions, and choice of substrate, this effect is exploited and ultrathin and exceptionally smooth layers of In2O3 are grown over large area substrates at temperatures as low as 252 degrees C. Thin-film transistors (TFTs) fabricated using these optimized In2O3 layers exhibit superior electron transport characteristics with the electron mobility reaching up to 40 cm(2) V-1 s(-1), a value amongst the highest reported to date for solution-processed In2O3 TFTs. The present work contributes enormously to the basic understanding of spray pyrolysis and highlights its tremendous potential for large-volume manufacturing of high-performance metal oxide thin-film transistor electronics.
机译:研究了在100-300摄氏度的温度范围内通过喷雾热解前驱体水溶液处理的氧化铟(In2O3)层的生长机理及其对电子传输性能的影响。对基底表面上的液滴撞击部位随温度变化的分析表明,莱顿弗罗斯特效应占主导的沸腾通过类气相过程在光滑,连续且高度结晶的In2O3层的生长中起着至关重要的作用。通过仔细优化前驱体配方,沉积条件和基板选择,可以利用这种效果,并在低至252摄氏度的温度下在超大面积基板上生长In2O3的超薄且异常光滑的层。薄膜晶体管(TFT)使用这些优化的In2O3层制造的薄膜具有优异的电子传输特性,电子迁移率高达40 cm(2)V-1 s(-1),是迄今为止溶液处理的In2O3 TFT报道的最高值。本工作为喷雾热解的基本理解做出了巨大贡献,并突出了其在高性能金属氧化物薄膜晶体管电子产品的批量生产中的巨大潜力。

著录项

  • 来源
    《Advanced Functional Materials》 |2017年第22期|1606407.1-1606407.9|共9页
  • 作者单位

    Imperial Coll London, Blackett Lab, London SW7 2AZ, England|Imperial Coll London, Ctr Plast Elect, London SW7 2AZ, England;

    Imperial Coll London, Blackett Lab, London SW7 2AZ, England|Imperial Coll London, Ctr Plast Elect, London SW7 2AZ, England;

    Imperial Coll London, Blackett Lab, London SW7 2AZ, England|Imperial Coll London, Ctr Plast Elect, London SW7 2AZ, England;

    Imperial Coll London, Blackett Lab, London SW7 2AZ, England|Imperial Coll London, Ctr Plast Elect, London SW7 2AZ, England;

    Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece;

    Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece;

    Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece;

    Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece;

    Cornell Univ, Wilson Lab, Cornell High Energy Synchrotron Source, Ithaca, NY 14853 USA;

    Imperial Coll London, Blackett Lab, London SW7 2AZ, England|Imperial Coll London, Ctr Plast Elect, London SW7 2AZ, England|King Abdullah Univ Sci & Technol, Div Phys Sci & Engn, Thuwal 239556900, Saudi Arabia;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    indium oxide; Leidenfrost effect; solution processing; spray pyrolysis; thin-film transistors;

    机译:氧化铟;Leidenfrost效应;固溶处理;喷雾热解;薄膜晶体管;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号