DETERMINATION OF THE RESIDUAL STRESS STATE IN A NATURAL TITANIUM OXIDE LAYER

摘要

The residual stress states in a naturally grown titanium oxide layer and its underlying substrate have been studied with X-ray diffraction. All three natural oxides (rutile, anatase and brookite) were found in the oxide. The residual stress has been determined for the ruffle phase using a numerical sin~2 Ψ analysis and compared with the stress state in the hexagonal α-phase of the Ti6Al4V alloy substrate.