Simultaneous Acquisition of Microscale Reflectance and Normals

摘要

Acquiring microscale reflectance and normals is useful for digitaldocumentation and identification of real-world materials. However,its simultaneous acquisition has rarely been explored due to the difficultiesof combining both sources of information at such smallscale. In this paper, we capture both spatially-varying material appearance(diffuse, specular and roughness) and normals simultaneouslyat the microscale resolution. We design and build a microscopiclight dome with 374 LED lights over the hemisphere, specificallytailored to the characteristics of microscopic imaging. Thisallows us to achieve the highest resolution for such combined informationamong current state-of-the-art acquisition systems. We thoroughlytest and characterize our system, and provide microscopicappearance measurements of a wide range of common materials,as well as renderings of novel views to validate the applicability ofour captured data. Additional applications such as bi-scale materialediting from real-world samples are also demonstrated.