Simultaneous Acquisition of Microscale Reflectance and Normals

摘要

Acquiring microscale reflectance and normals is useful for digitalrndocumentation and identification of real-world materials. However,rnits simultaneous acquisition has rarely been explored due to the difficultiesrnof combining both sources of information at such smallrnscale. In this paper, we capture both spatially-varying material appearancern(diffuse, specular and roughness) and normals simultaneouslyrnat the microscale resolution. We design and build a microscopicrnlight dome with 374 LED lights over the hemisphere, specificallyrntailored to the characteristics of microscopic imaging. Thisrnallows us to achieve the highest resolution for such combined informationrnamong current state-of-the-art acquisition systems. We thoroughlyrntest and characterize our system, and provide microscopicrnappearance measurements of a wide range of common materials,rnas well as renderings of novel views to validate the applicability ofrnour captured data. Additional applications such as bi-scale materialrnediting from real-world samples are also demonstrated.