机译
使用X射线微计算机断层扫描和外部束粒子诱导的X射线发射,对来自埃塞俄比亚,哥伦比亚,洪都拉斯和墨西哥的烘焙有机咖啡豆进行物理元素分析
摘要:Abbreviations: PIXE, particle induced X-ray emission; LDA, linear discriminant analysis; micro-CT, X-ray micro-computed tomographyKeywords: Ethiopia, Colombia, Honduras, External beam PIXE, Mexico, Organic, Roasted coffee bean, X-ray micro-computed tomographyAbstract
The physico-elemental profiles of commercially attained and roasted organic coffee beans from Ethiopia, Colombia, Honduras, and Mexico were compared using light microscopy, X-ray micro-computed tomography, and external beam particle induced X-ray emission. External beam PIXE analysis detected P, S, Cl, K, Ca, Ti, Mn, Fe, Cu, Zn, Br, Rb, and Sr in samples. Linear discriminant analysis showed that there was no strong association between elemental data and production region, whilst a heatmap combined with hierarchical clustering showed that soil-plant physico-chemical properties may influence regional elemental signatures. Physical trait data showed that Mexican coffee beans weighed significantly more than beans from other regions, whilst Honduras beans had the highest width. X-ray micro-computed tomography qualitative data showed heterogeneous microstructural features within and between beans representing different regions. In conclusion, such multi-dimensional analysis may present a promising tool in assessing the nutritional content and qualitative characteristics of food products such as coffee.