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Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout

机译:耐辐射的虚拟栅极辅助n-MOSFET布局的长宽比模型

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摘要

In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET has a rectangular channel shape, whereas the DGA n-MOSFET has an extended rectangular shape at the edge of the source and drain, which affects its aspect ratio. In order to increase its practical use, a new aspect ratio model is proposed for the DGA n-MOSFET and this model is evaluated through three-dimensional simulations and measurements of the fabricated devices. The proposed aspect ratio model for the DGA n-MOSFET exhibits good agreement with the simulation and measurement results.
机译:为了获得集成电路中的耐辐射特性,采用了伪栅极辅助的n型金属氧化物半导体场效应晶体管(DGA n-MOSFET)布局。与标准n-MOSFET相比,DGA n-MOSFET具有不同的沟道形状。标准n-MOSFET具有矩形沟道形状,而DGA n-MOSFET在源极和漏极的边缘具有扩展的矩形形状,这会影响其长宽比。为了增加其实用性,为DGA n-MOSFET提出了一个新的长宽比模型,并通过三维仿真和对制成器件的测量来评估该模型。为DGA n-MOSFET提出的长宽比模型与仿真和测量结果显示出良好的一致性。

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