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Effect of Time-Dependent Characteristics of ZnO Nanoparticles Electron Transport Layer Improved by Intense-Pulsed Light Post-Treatment on Hole-Electron Injection Balance of Quantum-Dot Light-Emitting Diodes

机译:ZnO纳米颗粒电子传输层的效果通过强烈脉冲后处理改善了量子点发光二极管空穴电子注入平衡的脉冲脉冲后处理

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摘要

We investigated the effect of intense-pulsed light (IPL) post-treatment on the time-dependent characteristics of ZnO nanoparticles (NPs) used as an electron transport layer (ETL) of quantum-dot light-emitting diodes (QLEDs). The time-dependent characteristics of the charge injection balance in QLEDs was observed by fabrication and analysis of single carrier devices (SCDs), and it was confirmed that the time-dependent characteristics of the ZnO NPs affect the device characteristics of QLEDs. Stabilization of the ZnO NPs film properties for improvement of the charge injection balance in QLEDs was achieved by controlling the current density characteristics via filling of the oxygen vacancies by IPL post-treatment.
机译:我们研究了激脉冲光(IPL)对ZnO纳米颗粒(NPS)的时间依赖性特性的影响,所述ZnO纳米颗粒(NPS)用作量子点发光二极管(QLED)的电子传输层(ETL)。通过制造和分析单载波装置(SCDS)观察QLED中电荷注射平衡的时间依赖性特征,并确认ZnO NP的时间依赖性影响QLED的装置特性。通过通过填充通过IPL后处理来控制电流密度特性来实现用于改善QLED中电荷注射平衡的ZnO NPS膜性能的稳定化。

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