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Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

机译:散装化学成分从AFM力光谱中的吸引力形成对比

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摘要

A key application of atomic force microscopy (AFM) is the measurement of physical properties at sub-micrometer resolution. Methods such as force–distance curves (FDCs) or dynamic variants (such as intermodulation AFM (ImAFM)) are able to measure mechanical properties (such as the local stiffness, kr) of nanoscopic heterogeneous materials. For a complete structure–property correlation, these mechanical measurements are considered to lack the ability to identify the chemical structure of the materials. In this study, the measured attractive force, Fattr, acting between the AFM tip and the sample is shown to be an independent measurement for the local chemical composition and hence a complete structure–property correlation can be obtained. A proof of concept is provided by two model samples comprised of (1) epoxy/polycarbonate and (2) epoxy/boehmite. The preparation of the model samples allowed for the assignment of material phases based on AFM topography. Additional chemical characterization on the nanoscale is performed by an AFM/infrared-spectroscopy hybrid method. Mechanical properties (kr) and attractive forces (Fattr) are calculated and a structure–property correlation is obtained by a manual principle component analysis (mPCA) from a kr/Fattr diagram. A third sample comprised of (3) epoxy/polycarbonate/boehmite is measured by ImAFM. The measurement of a 2 × 2 µm cross section yields 128 × 128 force curves which are successfully evaluated by a kr/Fattr diagram and the nanoscopic heterogeneity of the sample is determined.
机译:原子力显微镜(AFM)的关键施加是亚微米分辨率的物理性质的测量。诸如力距离曲线(FDC)或动态变体(例如互调AFM(IMAFM))的方法能够测量纳米镜的异质材料的机械性能(例如局部刚度,KR)。为了完整的结构性质相关性,认为这些机械测量值缺乏识别材料的化学结构的能力。在该研究中,测量的吸引力,在AFM尖端和样品之间作用的吸引力,显示为局部化学成分的独立测量,因此可以获得完全的结构性质相关性。概念证据由由(1)环氧/聚碳酸酯和(2)环氧/勃姆酸盐组成的两种模型样品提供。制备允许基于AFM地形分配材料阶段的模型样本。纳米级上的额外化学表征是通过AFM /红外光谱杂交方法进行的。计算机械性能(KR)和吸引力(FATTR),通过来自KR / FATTR图的手动原理分量分析(MPCA)获得结构性质相关性。由(3)环氧/聚碳酸酯/勃姆石组成的第三个样品由IMAFM测量。 2×2μm截面的测量产生128×128的力曲线,通过KR / FATTR图成功评价,并确定样品的纳米镜的异质性。

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