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Investigation of WO3 Electrodeposition Leading to Nanostructured Thin Films

机译:纳米结构薄膜WO3电沉积的研究

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摘要

Nanostructured WO represents a promising material for electrochromic and sensing devices. In this scenario, electrodeposition is a promising low-cost approach for careful production. The electrodeposition of tungsten oxide film from a peroxo-tungstic-acid (PTA) solution is investigated. WO is synthetized onto Indium doped Tin Oxide (ITO) substrates, in a variety of shapes, from a fragmentary, thin layer up to a thick continuous film. Samples were investigated by scanning electron (SEM) and atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS), X-ray Diffraction analysis (XRD), energy gap measurement. Electrodeposition current curves are compared with characterization results to model the growth process. Early stages of electrodeposition are characterized by a transient cathodic current revealing an instantaneous nucleation followed by a diffusion limited process. A quantitative analysis of W deposition rate and current at working electrode validates a microscopic model for WO electrodeposition driving the process towards nanostructured versus continuous WO film.
机译:纳米结构WO代表电致变色和传感装置的有希望的材料。在这种情况下,电码沉积是仔细生产的有希望的低成本方法。研究了来自过氧钨酸(PTA)溶液的氧化钨膜的电沉积。从碎片的薄层合成在掺杂掺杂的掺杂锡氧化锡(ITO)衬底上,从碎片的薄层合成到厚的连续膜上。通过扫描电子(SEM)和原子力显微镜(AFM),Rutherford反向散射光谱(RBS),X射线衍射分析(XRD),能隙测量来研究样品。将电沉积电流曲线与表征结果进行比较,以模拟生长过程。电沉积的早期阶段的特征在于瞬态阴极电流,显示瞬间成核,然后是扩散有限的过程。 W沉积速率和工作电极电流的定量分析验证了WO电沉积的微观模型驱动纳米结构与连续WO膜的过程。

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