Structural evolution and mechanism of strain glass transition in Ti48.7Ni51.3 shape memory alloy studied by anomalous small-angle X-ray scattering

摘要

( )(a’), ( )(b’), ( )(c’) and ( )(d’) 2D ASAXS patterns of the as-quenched Ti Ni SMA measured using 8000 eV and 8226 eV at 30 °C, −50 °C, 30 °C (again) and 250 °C, respectively. ( )(e’) Magnified images of the green square and blue square in ( , ), respectively, using 8000 eV at 30 °C and −50 °C, to show bright spots along the streak by the arrows.