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Electrical Transport and Thermoelectric Properties of SnSe–SnTe Solid Solution

机译:SnSe–SnTe固溶体的电输运和热电性质

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摘要

SnSe is considered as a promising thermoelectric (TE) material since the discovery of the record figure of merit (ZT) of 2.6 at 926 K in single crystal SnSe. It is, however, difficult to use single crystal SnSe for practical applications due to the poor mechanical properties and the difficulty and cost of fabricating a single crystal. It is highly desirable to improve the properties of polycrystalline SnSe whose TE properties are still not near to that of single crystal SnSe. In this study, in order to control the TE properties of polycrystalline SnSe, polycrystalline SnSe–SnTe solid solutions were fabricated, and the effect of the solid solution on the electrical transport and TE properties was investigated. The SnSe Te samples were fabricated using mechanical alloying and spark plasma sintering. X-ray diffraction (XRD) analyses revealed that the solubility limit of Te in SnSe Te is somewhere between x = 0.3 and 0.5. With increasing Te content, the electrical conductivity was increased due to the increase of carrier concentration, while the lattice thermal conductivity was suppressed by the increased amount of phonon scattering. The change of carrier concentration and electrical conductivity is explained using the measured band gap energy and the calculated band structure. The change of thermal conductivity is explained using the change of lattice thermal conductivity from the increased amount of phonon scattering at the point defect sites. A ZT of ~0.78 was obtained at 823 K from SnSe Te , which is an ~11% improvement compared to that of SnSe.
机译:自从在926 K的单晶SnSe中发现2.6的品质因数(ZT)以来,SnSe被认为是一种有前途的热电(TE)材料。然而,由于差的机械性能以及制造单晶的难度和成本,难以将单晶SnSe用于实际应用。非常需要改善其TE性能仍不接近单晶SnSe的多晶SnSe的性能。在这项研究中,为了控制多晶SnSe的TE特性,制备了多晶SnSe–SnTe固溶体,并研究了固溶体对电迁移和TE特性的影响。 SnSe Te样品是使用机械合金化和火花等离子体烧结制造的。 X射线衍射(XRD)分析表明,Te在SnSeTe中的溶解度极限在x = 0.3至0.5之间。随着Te含量的增加,电导率由于载流子浓度的增加而增加,而晶格热导率被声子散射量的增加所抑制。使用测得的带隙能量和计算出的带结构解释了载流子浓度和电导率的变化。用点缺陷部位声子散射量的增加引起的晶格热导率的变化来解释热导率的变化。 SnSe Te在823 K处获得的ZT为〜0.78,与SnSe相比提高了〜11%。

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