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Electronic and Morphological Inhomogeneities in Pristine and Deteriorated Perovskite Photovoltaic Films

机译:原始和劣化钙钛矿光伏薄膜中的电子和形态不均匀性

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摘要

We perform scanning microwave microscopy (SMM) to study the spatially varying electronic properties and related morphology of pristine and degraded methylammonium lead-halide (MAPI) perovskite films fabricated under different ambient humidity. We find that higher processing humidity leads to the emergence of increased conductivity at the grain boundaries but also correlates with the appearance of resistive grains that contain PbI2. Deteriorated films show larger and increasingly insulating grain boundaries as well as spatially localized regions of reduced conductivity within grains. These results suggest that while humidity during film fabrication primarily benefits device properties due to the passivation of traps at the grain boundaries and self-doping, it also results in the emergence of PbI2-containing grains. We further establish that MAPI film deterioration under ambient conditions proceeds via the spatially localized breakdown of film conductivity, both at grain boundaries and within grains, due to local variations in susceptibility to deterioration. These results confirm that PbI2 has both beneficial and adverse effects on device performance and provide new means for device optimization by revealing spatial variations in sample conductivity as well as morphological differences in resistance to sample deterioration.
机译:我们执行扫描微波显微镜(SMM),以研究在不同环境湿度下制作的原始和降解的甲基铵卤化铅(MAPI)钙钛矿薄膜的空间变化电子特性和相关形态。我们发现较高的加工湿度会导致晶界处电导率的增加,但也与包含PbI2的电阻性晶粒的外观相关。变质的薄膜显示出更大且日益绝缘的晶界以及晶粒内电导率降低的空间局部区域。这些结果表明,尽管膜制造过程中的湿度主要由于晶界处陷阱的钝化和自掺杂而使器件性能受益,但它也导致了含PbI2晶粒的出现。我们进一步确定,由于劣化敏感性的局部变化,在环境条件下,MAPI薄膜的劣化是通过在薄膜边界和晶粒内部的薄膜电导率的空间局部性破坏来进行的。这些结果证实了PbI2对器件性能既有正面影响又有负面影响,并通过揭示样品电导率的空间变化以及对样品劣化的抵抗力的形态差异,为器件优化提供了新的手段。

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