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Surface dose measurements with commonly used detectors: a consistent thickness correction method

机译:使用常用检测器进行表面剂量测量:一致的厚度校正方法

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摘要

The purpose of this study was to review application of a consistent correction method for the solid state detectors, such as thermoluminescent dosimeters (chips (cTLD) and powder (pTLD)), optically stimulated detectors (both closed (OSL) and open (eOSL)), and radiochromic (EBT2) and radiographic (EDR2) films. In addition, to compare measured surface dose using an extrapolation ionization chamber (PTW 30‐360) with other parallel plate chambers RMI‐449 (Attix), Capintec PS‐033, PTW 30‐329 (Markus) and Memorial. Measurements of surface dose for 6 MV photons with parallel plate chambers were used to establish a baseline. cTLD, OSLs, EDR2, and EBT2 measurements were corrected using a method which involved irradiation of three dosimeter stacks, followed by linear extrapolation of individual dosimeter measurements to zero thickness. We determined the magnitude of correction for each detector and compared our results against an alternative correction method based on effective thickness. All uncorrected surface dose measurements exhibited overresponse, compared with the extrapolation chamber data, except for the Attix chamber. The closest match was obtained with the Attix chamber (−0.1%), followed by pTLD (0.5%), Capintec (4.5%), Memorial (7.3%), Markus (10%), cTLD (11.8%), eOSL (12.8%), EBT2 (14%), EDR2 (14.8%), and OSL (26%). Application of published ionization chamber corrections brought all the parallel plate results to within 1% of the extrapolation chamber. The extrapolation method corrected all solid‐state detector results to within 2% of baseline, except the OSLs. Extrapolation of dose using a simple three‐detector stack has been demonstrated to provide thickness corrections for cTLD, eOSLs, EBT2, and EDR2 which can then be used for surface dose measurements. Standard OSLs are not recommended for surface dose measurement. The effective thickness method suffers from the subjectivity inherent in the inclusion of measured percentage depth‐dose curves and is not recommended for these types of measurements.PACS number: 87.56.‐v
机译:这项研究的目的是回顾一种一致的校正方法在固态检测器中的应用,例如热发光剂量计(芯片(cTLD)和粉末(pTLD)),光激发检测器(封闭式(OSL)和开放式(eOSL)) ),射线变色(EBT2)和射线照相(EDR2)胶片。此外,使用外推电离室(PTW 30-360)与其他平行板室RMI-449(Attix),Capintec PS-033,PTW 30-329(Markus)和Memorial来比较测量的表面剂量。使用带有平行板腔的6 MV光子的表面剂量测量来建立基线。使用以下方法校正cTLD,OSL,EDR2和EBT2测量值:该方法涉及对三个剂量计堆栈进行辐照,然后将各个剂量计测量值线性外推到零厚度。我们确定了每个检测器的校正幅度,并将我们的结果与基于有效厚度的另一种校正方法进行了比较。与外推腔数据相比,除Attix腔外,所有未校正的表面剂量测量均显示出响应过度。最接近的匹配是与Attix庭(-0.1%),其次是pTLD(0.5%),Capintec(4.5%),Memorial(7.3%),Markus(10%),cTLD(11.8%),eOSL(12.8) %),EBT2(14%),EDR2(14.8%)和OSL(26%)。应用已发布的电离室校正技术可使所有平行板结果均在外推室的1%之内。外推法将所有固态检测器的结果校正到基线的2%以内,OSL除外。已证明使用简单的三探测器堆栈进行剂量外推可为cTLD,eOSL,EBT2和EDR2提供厚度校正,然后可将其用于表面剂量测量。不建议将标准OSL用于表面剂量测量。有效厚度法受制于所测深度剂量百分比曲线固有的主观性,因此不建议用于这些类型的测量.PACS编号:87.56。

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