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Electrical structural and optical properties of sulfurized Sn-doped In2O3 nanowires

机译:硫化锡掺杂In2O3纳米线的电结构和光学性质

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摘要

Sn-doped In2O3 nanowires have been grown on Si via the vapor-liquid-solid mechanism at 800 °C and then exposed to H2S between 300 to 600 °C. We observe the existence of cubic bixbyite In2O3 and hexagonal SnS2 after processing the Sn:In2O3 nanowires to H2S at 300 °C but also cubic bixbyite In2O3, which remains dominant, and the emergence of rhombohedral In2(SO4)3 at 400 °C. The resultant nanowires maintain their metallic-like conductivity, and exhibit photoluminescence at 3.4 eV corresponding to band edge emission from In2O3. In contrast, Sn:In2O3 nanowires grown on glass at 500 °C can be treated under H2S only below 200 °C which is important for the fabrication of Cu2S/Sn:In2O3 core-shell p-n junctions on low-cost transparent substrates such as glass suitable for quantum dot-sensitized solar cells.
机译:锡掺杂的In2O3纳米线已通过汽-液-固机理在800°C的条件下在Si上生长,然后暴露于300至600°C的H2S中。在300°C下将Sn:In2O3纳米线加工成H2S之后,我们观察到立方方锰矿In2O3和六角形SnS2的存在,但仍然占据主导地位的立方方锰矿In2O3在400°C下出现菱形In2(SO4)3。所得的纳米线保持其类似金属的电导率,并在3.4 eV处显示光致发光,对应于In2O3的能带边缘发射。相比之下,在500°C的玻璃上生长的Sn:In 2 O 3 纳米线只能在低于200°C的H 2 S下处理这对于在低成本透明基板上制备Cu 2 S / Sn:In 2 O 3 核-壳pn结非常重要作为适合量子点敏化太阳能电池的玻璃。

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