Aligned Chemically Etched Silver Nanowire Monolayer as Surface-Enhanced Raman Scattering Substrates

摘要

Silver nanowires (AgNWs) were chemically etched to significantly increase the surface roughness and then self-assembled on the liquid/gas interfaces via the interfacial assembly method to obtain aligned chemically etched silver nanowire films. The as-fabricated silver nanowire films were used as novel surface-enhanced Raman scattering (SERS) substrates. The morphologies and plasmon characteristics of the substrates were investigated using multiple measurement methods. The performance of as-fabricated substrates was measured using rhodamine B as a probe. The detection limitation can be as low as 10⁻¹¹ M. The greatly improved plasmonic properties are attributed to the efficient light coupling and larger electromagnetic field enhancement. The novel set of SERS substrates of aligned chemically etched AgNWs is believed to be important for efficient, homogeneous, and ultrasensitive SERS sensing applications.