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Suppression of non-radiative surface recombination by N incorporation in GaAs/GaNAs core/shell nanowires

机译:通过在GaAs / GaNAs核/壳纳米线中掺入N来抑制非辐射表面复合

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摘要

III-V semiconductor nanowires (NWs) such as GaAs NWs form an interesting artificial materials system promising for applications in advanced optoelectronic and photonic devices, thanks to the advantages offered by the 1D architecture and the possibility to combine it with the main-stream silicon technology. Alloying of GaAs with nitrogen can further enhance performance and extend device functionality via band-structure and lattice engineering. However, due to a large surface-to-volume ratio, III-V NWs suffer from severe non-radiative carrier recombination atear NWs surfaces that significantly degrades optical quality. Here we show that increasing nitrogen composition in novel GaAs/GaNAs core/shell NWs can strongly suppress the detrimental surface recombination. This conclusion is based on our experimental finding that lifetimes of photo-generated free excitons and free carriers increase with increasing N composition, as revealed from our time-resolved photoluminescence (PL) studies. This is accompanied by a sizable enhancement in the PL intensity of the GaAs/GaNAs core/shell NWs at room temperature. The observed N-induced suppression of the surface recombination is concluded to be a result of an N-induced modification of the surface states that are responsible for the nonradiative recombination. Our results, therefore, demonstrate the great potential of incorporating GaNAs in III-V NWs to achieve efficient nano-scale light emitters.
机译:一维架构的优势以及将其与主流硅技术相结合的可能性,诸如GaAs NW之类的III-V半导体纳米线(NW)形成了一种有趣的人工材料系统,有望在先进的光电和光子器件中应用。 。 GaAs与氮的合金化可通过能带结构和晶格工程技术进一步提高性能并扩展器件功能。但是,由于较大的表面体积比,III-V型NW在/靠近NWs的表面会遭受严重的非辐射载流子复合,这会严重降低光学质量。在这里,我们表明,新型GaAs / GaNAs核/壳NW中的氮成分增加可以强烈抑制有害的表面重组。该结论基于我们的实验发现,正如我们的时间分辨光致发光(PL)研究所揭示的那样,光生自由激子和自由载流子的寿命随着N组成的增加而增加。这伴随着室温下GaAs / GaNAs核/壳型NW的PL强度的显着提高。结论是观察到的N诱导的表面重组抑制是由N诱导的负责非辐射重组的表面状态改变的结果。因此,我们的结果证明了将GaNA集成到III-V型NW中的巨大潜力,以实现高效的纳米级发光体。

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