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Bare and boron-doped cubic silicon carbide nanowires for electrochemical detection of nitrite sensitively

机译:裸露和掺硼的立方碳化硅纳米线用于亚硝酸盐的电化学检测

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摘要

Fabrication of eletrochemical sensors based on wide bandgap compound semiconductors has attracted increasing interest in recent years. Here we report for the first time electrochemical nitrite sensors based on cubic silicon carbide (SiC) nanowires (NWs) with smooth surface and boron-doped cubic SiC NWs with fin-like structure. Multiple techniques including scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and electron energy loss spectroscopy (EELS) were used to characterize SiC and boron-doped SiC NWs. As for the electrochemical behavior of both SiC NWs electrode, the cyclic voltammetric results show that both SiC electrodes exhibit wide potential window and excellent electrocatalytic activity toward nitrite oxidation. Differential pulse voltammetry (DPV) determination reveals that there exists a good linear relationship between the oxidation peak current and the concentration in the range of 50–15000 μmoL L−1 (cubic SiC NWs) and 5–8000 μmoL L−1 (B-doped cubic SiC NWs) with the detection limitation of 5 and 0.5 μmoL L−1 respectively. Compared with previously reported results, both as-prepared nitrite sensors exhibit wider linear response range with comparable high sensitivity, high stability and reproducibility.
机译:近年来,基于宽带隙化合物半导体的电子化学传感器的制造吸引了越来越多的兴趣。在这里,我们首次报道了基于具有光滑表面的立方碳化硅(SiC)纳米线(NWs)和具有鳍状结构的掺硼立方SiC NWs的电化学亚硝酸盐传感器。使用包括扫描电子显微镜(SEM),透射电子显微镜(TEM),X射线衍射(XRD),X射线光电子能谱(XPS)和电子能量损失能谱(EELS)在内的多种技术来表征SiC和掺硼SiC NW。关于两个SiC NWs电极的电化学行为,循环伏安结果表明,两个SiC电极均具有宽的电势窗口和对亚硝酸盐氧化的优异电催化活性。差示脉冲伏安法(DPV)测定表明,氧化峰电流与浓度在50–15000μmoLL -1 (立方SiC NWs)和5–8000之间的浓度之间存在良好的线性关系。 μmoLL -1 (B掺杂立方SiC NWs)的检出限分别为5和0.5μμLLs -1 。与先前报告的结果相比,两种制备的亚硝酸盐传感器均具有更宽的线性响应范围,并具有可比的高灵敏度,高稳定性和可重复性。

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