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Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements

机译:使用z扫描测量表征超富硅氮化物的光学非线性

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摘要

The dispersive nonlinear refractive index of ultra-silicon-rich nitride, and its two-photon and three-photon absorption coefficients are measured in the wavelength range between 0.8 µm–1.6 µm, covering the O- to L – telecommunications bands. In the two-photon absorption range, the measured nonlinear coefficients are compared to theoretically calculated values with a simple parabolic band structure. Two-photon absorption is observed to exist only at wavelengths lower than 1.2 μm. The criterion for all-optical switching through the material is investigated and it is shown that ultra-silicon-rich nitride is a good material in the three-photon absorption region, which spans the entire O- to L- telecommunications bands.
机译:富硅的氮化物的色散非线性折射率及其二光子和三光子的吸收系数是在覆盖O-至L-电信频段的0.8 µm至1.6µµm的波长范围内测量的。在双光子吸收范围内,将测量的非线性系数与具有简单抛物线能带结构的理论计算值进行比较。观察到仅在低于1.2μm的波长处存在双光子吸收。研究了通过该材料进行全光切换的标准,结果表明,富含硅的氮化物在三光子吸收区域中是一种很好的材料,该区域涵盖了整个O到L电信频段。

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