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Understanding stability diagram of perpendicular magnetic tunnel junctions

机译:了解垂直磁性隧道结的稳定性图

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摘要

Perpendicular magnetic tunnel junctions (MTJ) with a bottom pinned reference layer and a composite free layer (FL) are investigated. Different thicknesses of the FL were tested to obtain an optimal balance between tunneling magnetoresistance (TMR) ratio and perpendicular magnetic anisotropy. After annealing at 400 °C, the TMR ratio for 1.5 nm thick CoFeB sublayer reached 180% at room temperature and 280% at 20 K with an MgO tunnel barrier thickness corresponding to the resistance area product RA = 10 Ohmμm2. The voltage vs. magnetic field stability diagrams measured in pillar-shaped MTJs with 130 nm diameter indicate the competition between spin transfer torque (STT), voltage controlled magnetic anisotropy (VCMA) and temperature effects in the switching process. An extended stability phase diagram model that takes into account all three effects and the effective damping measured independently using broadband ferromagnetic resonance technique enabled the determination of both STT and VCMA coefficients that are responsible for the FL magnetization switching.
机译:研究了具有底部固定参考层和复合自由层(FL)的垂直磁隧道结(MTJ)。测试了FL的不同厚度,以获得隧穿磁阻(TMR)比和垂直磁各向异性之间的最佳平衡。在400 C下退火后,厚1.5 nm的CoFeB子层的TMR比在室温下达到180%,在20 K下达到280%,MgO隧道势垒厚度对应于电阻面积乘积RA = 10Ohmμm 2 。在直径为130 nm的柱形MTJ中测得的电压与磁场稳定性图表明,自旋传递转矩(STT),压控磁各向异性(VCMA)和开关过程中的温度效应之间存在竞争。一个扩展的稳定性相图模型,该模型考虑了所有三个效应以及使用宽带铁磁共振技术独立测量的有效阻尼,从而能够确定负责FL磁化切换的STT和VCMA系数。

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