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Errors in the measurement of voltage-activated ion channels in cell-attached patch-clamp recordings

机译:贴有细胞的膜片钳记录中电压激活离子通道的测量误差

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摘要

Patch-clamp recording techniques have revolutionized understanding of the function and sub-cellular location of ion channels in excitable cells. The cell-attached patch-clamp configuration represents the method of choice to describe the endogenous properties of voltage-activated ion channels in the axonal, somatic and dendritic membrane of neurons, without disturbance of the intracellular milieu. Here, we directly examine the errors associated with cell-attached patch-clamp measurement of ensemble ion channel activity. We find for a number of classes of voltage-activated channels, recorded from the soma and dendrites of neurons in acute brain-slices and isolated cells, that the amplitude and kinetics of ensemble ion channel activity recorded in cell-attached patches is significantly distorted by transmembrane voltage changes generated by the flow of current through the activated ion channels. We outline simple error–correction procedures that allow a more accurate description of the density and properties of voltage-activated channels to be incorporated into computational models of neurons.
机译:膜片钳记录技术彻底改变了对可激发细胞中离子通道的功能和亚细胞位置的了解。附有细胞的膜片钳配置代表了描述神经元轴突,体细胞和树突状膜中电压激活离子通道的内源特性而不影响细胞内环境的选择方法。在这里,我们直接检查与整体离子通道活性的细胞附着膜片钳测量相关的误差。我们发现,从急性脑切片和分离细胞中神经元的体细胞和树突记录的许多类电压激活通道中,细胞附着斑块中记录的集合离子通道活性的幅度和动力学受以下因素严重扭曲:电流通过激活的离子通道产生的跨膜电压变化。我们概述了简单的纠错程序,这些程序允许对电压激活通道的密度和特性进行更准确的描述,以将其合并到神经元的计算模型中。

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