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Improving image contrast and material discrimination with nonlinear response in bimodal atomic force microscopy

机译:利用双峰原子力显微镜的非线性响应改善图像对比度和材料辨别力

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摘要

Atomic force microscopy has recently been extented to bimodal operation, where increased image contrast is achieved through excitation and measurement of two cantilever eigenmodes. This enhanced material contrast is advantageous in analysis of complex heterogeneous materials with phase separation on the micro or nanometre scale. Here we show that much greater image contrast results from analysis of nonlinear response to the bimodal drive, at harmonics and mixing frequencies. The amplitude and phase of up to 17 frequencies are simultaneously measured in a single scan. Using a machine-learning algorithm we demonstrate almost threefold improvement in the ability to separate material components of a polymer blend when including this nonlinear response. Beyond the statistical analysis performed here, analysis of nonlinear response could be used to obtain quantitative material properties at high speeds and with enhanced resolution.
机译:原子力显微镜最近已扩展到双峰操作,其中通过激发和测量两个悬臂本征模式实现了更高的图像对比度。这种增强的材料对比度在分析具有微米或纳米级相分离的复杂异质材料时非常有利。在这里,我们表明,通过分析在谐波和混合频率下对双峰驱动的非线性响应,可以获得更大的图像对比度。一次扫描可同时测量多达17个频率的幅度和相位。使用机器学习算法,当包含这种非线性响应时,我们证明了分离聚合物共混物材料成分的能力几乎提高了三倍。除了此处执行的统计分析之外,还可以使用非线性响应分析来获得高速且分辨率更高的定量材料属性。

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