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High surface recombination velocity limits Quasi-Fermi level splitting in kesterite absorbers

机译:高表面复合速度限制了钾钛矿吸收剂的准费米能级分裂

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摘要

Kelvin Probe Force Microscopy, Photoluminescence imaging and numerical simulations are used to study the surfaces of Cu2ZnSnSe4 absorber layers. In particular, the effect of NH4OH and annealing under ambient conditions is investigated. We observe drastic changes in the measured quasi Fermi-level splitting (QFLs) after chemical cleaning of the absorber surface with NH4OH, which is traced back to a removal of the surface inversion. Air annealing recovers surface inversion, which reduces the recombination current at the surface. Annealing above 200 °C leads to a permanent change in the work function which cannot be modified by NH4OH etching anymore. This modification makes the QFLs insensitive to surface cleaning and explains why air annealing in Cu2ZnSnSe4 is important. From numerical simulations we find that a large surface recombination velocity needs to be present in order to describe the experimental observations.
机译:开尔文探针力显微镜,光致发光成像和数值模拟用于研究Cu2ZnSnSe4吸收层的表面。特别是,研究了NH4OH和在环境条件下退火的影响。在用NH4OH化学清洗吸收体表面后,我们观察到测得的准费米能级分裂(QFL)发生了巨大变化,这可追溯到去除了表面反转。空气退火可恢复表面反转,从而减少表面的重组电流。高于200°C的温度退火会导致功函数发生永久性变化,无法再通过NH4OH蚀刻进行修改。这种修改使QFL对表面清洁不敏感,并解释了为什么在Cu2ZnSnSe4中进行空气退火很重要。从数值模拟中我们发现,为了描述实验观察结果,需要存在较大的表面复合速度。

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