Two-dimensional transition metal carbides (MXenes) have attracted a great interest of the research community as a relatively recently discovered large class of materials with unique electronic and optical properties. Understanding of adhesion between MXenes and various substrates is critically important for MXene device fabrication and performance. We report results of direct atomic force microscopy (AFM) measurements of adhesion of two MXenes (Ti3C2Tx and Ti2CTx) with a SiO2 coated Si spherical tip. The Maugis-Dugdale theory was applied to convert the AFM measured adhesion force to adhesion energy, while taking into account surface roughness. The obtained adhesion energies were compared with those for mono-, bi-, and tri-layer graphene, as well as SiO2 substrates. The average adhesion energies for the MXenes are 0.90 ± 0.03 J m−2 and 0.40 ± 0.02 J m−2 for thicker Ti3C2Tx and thinner Ti2CTx, respectively, which is of the same order of magnitude as that between graphene and silica tip.
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机译：二维过渡金属碳化物（MXenes）引起了研究界的极大兴趣，因为相对较新发现的具有独特电子和光学特性的大量材料。对于MXene器件的制造和性能，了解MXene与各种基材之间的粘附力至关重要。我们报告的直接原子力显微镜（AFM）测量结果的两个MXenes（Ti3C2Tx和Ti2CTx）与SiO2涂层的硅球形尖端的附着力。应用莫吉斯-杜格代尔理论，同时考虑了表面粗糙度，将AFM测得的粘附力转换为粘附能。将获得的粘附能与单层，双层和三层石墨烯以及SiO2基底的粘附能进行比较。对于较厚的Ti3C2Tx和较薄的Ti2CTx，MXene的平均粘附能分别为0.90±0.03 J m -2 和0.40±0.02 J m -2 与石墨烯和二氧化硅尖端的数量级相同。
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