首页> 美国卫生研究院文献>Nature Communications >Nature of the metal-insulator transition in few-unit-cell-thick LaNiO3 films
【2h】

Nature of the metal-insulator transition in few-unit-cell-thick LaNiO3 films

机译:几单元厚度的LaNiO3薄膜中金属-绝缘体转变的性质

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

The nature of the metal-insulator transition in thin films and superlattices of LaNiO3 only a few unit cells in thickness remains elusive despite tremendous effort. Quantum confinement and epitaxial strain have been evoked as the mechanisms, although other factors such as growth-induced disorder, cation non-stoichiometry, oxygen vacancies, and substrate–film interface quality may also affect the observable properties of ultrathin films. Here we report results obtained for near-ideal LaNiO3 films with different thicknesses and terminations grown by atomic layer-by-layer laser molecular beam epitaxy on LaAlO3 substrates. We find that the room-temperature metallic behavior persists until the film thickness is reduced to an unprecedentedly small 1.5 unit cells (NiO2 termination). Electronic structure measurements using X-ray absorption spectroscopy and first-principles calculation suggest that oxygen vacancies existing in the films also contribute to the metal-insulator transition.
机译:尽管付出了巨大的努力,但LaNiO3薄膜和超晶格中金属-绝缘体转变的本质仍然难以捉摸。尽管其他因素(如生长诱发的紊乱,阳离子非化学计量比,氧空位以及底物-膜界面质量)也可能影响超薄膜的可观察特性,但人们已经将量子限制和外延应变作为其机理。在这里,我们报告了在LaAlO3基板上通过原子层到层激光分子束外延生长的具有不同厚度和端接的近理想LaNiO3薄膜的结果。我们发现室温金属行为一直持续到薄膜厚度减小到前所未有的小1.5单位电池(NiO2终止)。使用X射线吸收光谱法和第一性原理计算的电子结构测量表明,薄膜中存在的氧空位也有助于金属-绝缘体的转变。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号