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Modulator design for x-ray scatter correction using primary modulation: Material selection

机译:使用主调制进行X射线散射校正的调制器设计:材料选择

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>Purpose: An optimal material selection for primary modulator is proposed in order to minimize beam hardening of the modulator in x-ray cone-beam computed tomography (CBCT). Recently, a measurement-based scatter correction method using primary modulation has been developed and experimentally verified. In the practical implementation, beam hardening of the modulator blocker is a limiting factor because it causes inconsistency in the primary signal and therefore degrades the accuracy of scatter correction.>Methods: This inconsistency can be purposely assigned to the effective transmission factor of the modulator whose variation as a function of object filtration represents the magnitude of beam hardening of the modulator. In this work, the authors show that the variation reaches a minimum when the K-edge of the modulator material is near the mean energy of the system spectrum. Accordingly, an optimal material selection can be carried out in three steps. First, estimate and evaluate the polychromatic spectrum for a given x-ray system including both source and detector; second, calculate the mean energy of the spectrum and decide the candidate materials whose K-edge energies are near the mean energy; third, select the optimal material from the candidates after considering both the magnitude of beam hardening and the physical and chemical properties.>Results: A tabletop x-ray CBCT system operated at 120 kVp is used to validate the material selection method in both simulations and experiments, from which the optimal material for this x-ray system is then chosen. With the transmission factor initially being 0.905 and 0.818, simulations show that erbium provides the least amount of variation as a function of object filtrations (maximum variations are 2.2% and 4.3%, respectively, only one-third of that for copper). With different combinations of aluminum and copper filtrations (simulating a range of object thicknesses), measured overall variations are 2.5%, 1.0%, and 8.6% for 25.4 μm of copper, erbium, and tungsten, respectively. With and without 300 μm of copper in the beam, the measured variations for 25.4 μm of copper, erbium, and tungsten, 1 mm of aluminum, as well as 406 μm of copper, are 1.8%, 0.2%, 5.5%, 1.9%, and 7.5%, respectively.>Conclusions: The spatial variation in the effective transmission factor of the modulator blocker due to beam hardening caused by the modulator itself reaches a minimum when the K-edge of the modulator material is near the mean energy of the spectrum. An optimal modulator material selection using the K-edge discontinuity is therefore proposed.
机译:>目的:为在X射线锥束计算机断层扫描(CBCT)中最大程度地减少调制器的光束硬化,提出了用于主调制器的最佳材料选择。近来,已经开发并实验验证了使用一次调制的基于测量的散射校正方法。在实际实现中,调制器阻断器的光束硬化是一个限制因素,因为它会导致原始信号不一致,从而降低散射校正的准确性。>方法:调制器的传输因数,其随目标滤波而变化的幅度表示调制器的光束硬化程度。在这项工作中,作者表明,当调制器材料的K边缘接近系统频谱的平均能量时,变化达到最小。因此,可以在三个步骤中进行最佳的材料选择。首先,估算和评估给定X射线系统(包括源和检测器)的多色光谱;其次,计算光谱的平均能量,并确定其K边能量接近平均能量的候选材料。第三,在考虑束硬化的幅度以及物理和化学性质的情况下,从候选材料中选择最佳材料。>结果:使用工作在120 kVp的台式X射线CBCT系统验证材料在模拟和实验中都选择一种方法,然后从中选择用于该X射线系统的最佳材料。传输系数最初为0.905和0.818,模拟显示simulation提供的最小变化量是对象过滤的函数(最大变化分别为2.2%和4.3%,仅为铜的三分之一)。使用铝和铜过滤的不同组合(模拟对象厚度范围),对于25.4μm的铜,和钨,测得的总体变化分别为2.5%,1.0%和8.6%。在光束中有无300μm的铜的情况下,对于25.4μm的铜、,和钨,1 mm的铝以及406μm的铜,测得的变化分别为1.8%,0.2%,5.5%,1.9% >结论:当调制器材料的K边缘为时,由于调制器自身引起的光束硬化而导致的调制器阻滞剂有效传输因子的空间变化达到最小。接近光谱的平均能量。因此,提出了使用K边缘不连续性的最佳调制器材料选择。

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