首页> 美国卫生研究院文献>Journal of Applied Physics >Use of the Bethe Equation for Inner-Shell Ionization by Electron Impact
【2h】

Use of the Bethe Equation for Inner-Shell Ionization by Electron Impact

机译:Bethe方程在电子轰击内壳电离中的应用

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

We analyzed calculated cross sections for K-, L-, and M-shell ionization by electron impact to determine the energy ranges over which these cross sections are consistent with the Bethe equation for inner-shell ionization. Our analysis was performed with K-shell ionization cross sections for 26 elements, with L-shell ionization cross sections for seven elements, with L3-subshell ionization cross sections for Xe, and with M-shell ionization cross sections for three elements. The validity or otherwise of the Bethe equation could be checked with Fano plots based on a linearized form of the Bethe equation. Our Fano plots, which display theoretical cross sections and available measured cross sections, reveal two linear regions as predicted by de Heer and Inokuti. For each region, we made linear fits and determined values of the two element-specific Bethe parameters. We found systematic variations of these parameters with atomic number for both the low- and the high-energy linear regions of the Fano plots. We also determined the energy ranges over which the Bethe equation can be used.
机译:我们通过电子碰撞分析了计算的K,L和M壳电离截面,以确定这些截面与Bethe内壳电离方程相符的能量范围。我们的分析是用26个元素的K壳电离截面,七个元素的L壳电离截面,Xe的L3壳电离截面和三个元素的M壳电离截面进行的。可以基于贝特方程的线性化形式,通过Fano图来检查贝特方程是否有效。我们的Fano图显示了理论横截面和可用的测量横截面,揭示了de Heer和Inokuti预测的两个线性区域。对于每个区域,我们进行了线性拟合并确定了两个特定于元素的Bethe参数的值。我们发现在Fano图的低能和高能线性区域中,这些参数随原子序数的系统变化。我们还确定了可以使用Bethe方程的能量范围。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号