首页> 美国卫生研究院文献>Beilstein Journal of Nanotechnology >Oblique angle deposition of nickel thin films by high-power impulse magnetron sputtering
【2h】

Oblique angle deposition of nickel thin films by high-power impulse magnetron sputtering

机译:大功率脉冲磁控溅射镍薄膜的斜角沉积

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

>Background: Oblique angle deposition is known for yielding the growth of columnar grains that are tilted in the direction of the deposition flux. Using this technique combined with high-power impulse magnetron sputtering (HiPIMS) can induce unique properties in ferromagnetic thin films. Earlier we have explored the properties of polycrystalline and epitaxially deposited permalloy thin films deposited under 35° tilt using HiPIMS and compared it with films deposited by dc magnetron sputtering (dcMS). The films prepared by HiPIMS present lower anisotropy and coercivity fields than films deposited with dcMS. For the epitaxial films dcMS deposition gives biaxial anisotropy while HiPIMS deposition gives a well-defined uniaxial anisotropy. >Results: We report on the deposition of 50 nm polycrystalline nickel thin films by dcMS and HiPIMS while the tilt angle with respect to the substrate normal is varied from 0° to 70°. The HiPIMS-deposited films are always denser, with a smoother surface and are magnetically softer than the dcMS-deposited films under the same deposition conditions. The obliquely deposited HiPIMS films are significantly more uniform in terms of thickness. Cross-sectional SEM images reveal that the dcMS-deposited film under 70° tilt angle consists of well-defined inclined nanocolumnar grains while grains of HiPIMS-deposited films are smaller and less tilted. Both deposition methods result in in-plane isotropic magnetic behavior at small tilt angles while larger tilt angles result in uniaxial magnetic anisotropy. The transition tilt angle varies with deposition method and is measured around 35° for dcMS and 60° for HiPIMS. >Conclusion: Due to the high discharge current and high ionized flux fraction, the HiPIMS process can suppress the inclined columnar growth induced by oblique angle deposition. Thus, the ferromagnetic thin films obliquely deposited by HiPIMS deposition exhibit different magnetic properties than dcMS-deposited films. The results demonstrate the potential of the HiPIMS process to tailor the material properties for some important technological applications in addition to the ability to fill high aspect ratio trenches and coating on cutting tools with complex geometries.
机译:>背景:倾斜角沉积法已知会产生沿沉积通量方向倾斜的柱状晶粒的生长。结合使用此技术和大功率脉冲磁控溅射(HiPIMS),可以在铁磁薄膜中诱导出独特的性能。早先我们已经研究了使用HiPIMS在35°倾斜下沉积的多晶和外延沉积的坡莫合金薄膜的特性,并将其与通过dc磁控溅射(dcMS)沉积的薄膜进行了比较。由HiPIMS制备的薄膜比通过dcMS沉积的薄膜具有更低的各向异性和矫顽力场。对于外延膜,dcMS沉积产生双轴各向异性,而HiPIMS沉积产生明确的单轴各向异性。 >结果:我们报道了通过dcMS和HiPIMS沉积50 nm多晶镍薄膜的过程,而相对于基板法线的倾斜角从0°到70°不等。在相同的沉积条件下,HiPIMS沉积的薄膜始终比dcMS沉积的薄膜更致密,表面更光滑且磁软。倾斜沉积的HiPIMS膜的厚度明显更均匀。横截面SEM图像显示,倾斜角度为70°的dcMS沉积膜由定义明确的倾斜纳米柱状晶粒组成,而HiPIMS沉积膜的晶粒更小且倾斜程度更低。两种沉积方法均会在较小的倾斜角下产生面内各向同性的磁行为,而较大的倾斜角会导致单轴磁各向异性。过渡倾斜角随沉积方法而变化,对于dcMS测量为35°,对于HiPIMS测量为60°。 >结论:由于高放电电流和高电离通量分数,HiPIMS工艺可以抑制倾斜角沉积引起的倾斜柱状生长。因此,通过HiPIMS沉积倾斜沉积的铁磁薄膜表现出与dcMS沉积薄膜不同的磁性。结果表明,HiPIMS工艺具有潜力,除了能够填充高深宽比的沟槽和在具有复杂几何形状的切削刀具上进行涂层外,还可以为某些重要的技术应用定制材料性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号