【2h】

Sources of Error in UV Radiation Measurements

机译:紫外线辐射测量中的误差源

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摘要

Increasing commercial, scientific, and technical applications involving ultraviolet (UV) radiation have led to the demand for improved understanding of the performance of instrumentation used to measure this radiation. There has been an effort by manufacturers of UV measuring devices (meters) to produce simple, optically filtered sensor systems to accomplish the varied measurement needs. We address common sources of measurement errors using these meters. The uncertainty in the calibration of the instrument depends on the response of the UV meter to the spectrum of the sources used and its similarity to the spectrum of the quantity to be measured. In addition, large errors can occur due to out-of-band, non-linear, and non-ideal geometric or spatial response of the UV meters. Finally, in many applications, how well the response of the UV meter approximates the presumed action spectrum needs to be understood for optimal use of the meters.
机译:涉及紫外线(UV)辐射的商业,科学和技术应用越来越多,这导致人们需要对用于测量该辐射的仪器的性能有更好的了解。紫外线测量设备(仪表)的制造商一直在努力生产简单的,经过光学过滤的传感器系统,以满足各种测量需求。我们使用这些仪表解决常见的测量误差源。仪器校准中的不确定性取决于紫外线计对所用光源的光谱的响应及其与要测量的量的光谱的相似性。此外,由于紫外线检测仪的带外,非线性和不理想的几何或空间响应,可能会发生较大的误差。最后,在许多应用中,需要了解紫外线计的响应与假定的作用谱之间的近似程度,以最佳地使用紫外线计。

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