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A Study on Parametric Amplification in a Piezoelectric MEMS Device

机译:压电MEMS器件中参数放大的研究。

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摘要

In various applications, damping from the surrounding fluid severely degrades the performance of micro-electro-mechanical systems (MEMS). In this paper, mechanical amplification through parametric resonance was investigated in a piezoelectrically actuated MEMS to overcome the effects of damping. The device was fabricated using the PiezoMUMPS process, which is based on a Silicon-on-Insulator (SOI) process with an additional aluminum nitride (AlN) layer. Here, a double-clamped cantilever beam with a concentrated mass at the center was excited at its first resonance mode (out-of-plane motion) in air and at atmospheric conditions. A parametric signal modulating the stiffness of the beam was added at twice the frequency of the excitation signal, which was swept through the resonance frequency of the mode. The displacement at the center of the device was detected optically. A four-fold increase in the quality-factor, Q, of the resonator was obtained at the highest values in amplitude used for the parametric excitation. The spring modulation constant was obtained from the effective quality-factor, Qeff, versus parametric excitation voltage curve. This study demonstrates that through these methods, significant improvements in performance of MEMS in fluids can be obtained, even for devices fabricated using standard commercial processes.
机译:在各种应用中,来自周围流体的阻尼严重降低了微机电系统(MEMS)的性能。在本文中,在压电致动的MEMS中研究了通过参数共振进行的机械放大,以克服阻尼的影响。该器件使用PiezoMUMPS工艺制造,该工艺基于绝缘体上硅(SOI)工艺以及额外的氮化铝(AlN)层。在这里,在空气中和大气条件下,以其中心质量集中的双夹持悬臂梁以其第一共振模式(平面外运动)被激发。调制光束刚度的参数信号以激发信号频率的两倍被添加,该激发信号被扫过该模式的共振频率。用光学方法检测装置中心的位移。在用于参量激励的振幅的最高值处,谐振器的品质因数Q增加了四倍。弹簧调制常数是从有效品质因数 Q e f f ,相对于参数励磁电压曲线。这项研究表明,通过这些方法,即使对于使用标准商业流程制造的设备,也可以显着改善MEMS在流体中的性能。

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