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Microscopic View of Defect Evolution in Thermal Treated AlGaInAs Quantum Well Revealed by Spatially Resolved Cathodoluminescence

机译:通过空间分辨阴极发光很好地揭示了经热处理的AlGaInAs量子中缺陷演化的微观视图

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摘要

An aluminum gallium indium arsenic (AlGaInAs) material system is indispensable as the active layer of diode lasers emitting at 1310 or 1550 nm, which are used in optical fiber communications. However, the course of the high-temperature instability of a quantum well structure, which is closely related to the diffusion of indium atoms, is still not clear due to the system’s complexity. The diffusion process of indium atoms was simulated by thermal treatment, and the changes in the optical and structural properties of an AlGaInAs quantum well are investigated in this paper. Compressive strained Al0.07Ga0.22In0.71As quantum wells were treated at 170 °C with different heat durations. A significant decrement of photoluminescence decay time was observed on the quantum well of a sample that was annealed after 4 h. The microscopic cathodoluminescent (CL) spectra of these quantum wells were measured by scanning electron microscope-cathodoluminescence (SEM-CL). The thermal treatment effect on quantum wells was characterized via CL emission peak wavelength and energy density distribution, which were obtained by spatially resolved cathodoluminescence. The defect area was clearly observed in the Al0.07Ga0.22In0.71As quantum wells layer after thermal treatment. CL emissions from the defect core have higher emission energy than those from the defect-free regions. The defect core distribution, which was associated with indium segregation gradient distribution, showed asymmetric character.
机译:铝镓铟砷(AlGaInAs)材料系统作为在1310或1550 nm处发射的二极管激光器的有源层必不可少,这些二极管激光器用于光纤通信中。但是,由于系统的复杂性,与铟原子的扩散密切相关的量子阱结构的高温不稳定性的过程仍然不清楚。通过热处理模拟了铟原子的扩散过程,并研究了AlGaInAs量子阱的光学和结构性质的变化。压缩应变Al0.07Ga0.22In0.71As量子阱在170°C下以不同的加热时间进行处理。在4 h后退火的样品的量子阱上观察到光致发光衰减时间的显着减少。通过扫描电子显微镜-阴极发光(SEM-CL)测量这些量子阱的显微阴极发光(CL)光谱。通过空间分辨阴极发光获得的CL发射峰波长和能量密度分布来表征对量子阱的热处理效果。热处理后,在Al0.07Ga0.22In0.71As量子阱层中清楚地观察到了缺陷区域。缺陷核心的CL发射具有比无缺陷区域更高的发射能量。缺陷核心分布与铟的偏析梯度分布有关,表现出不对称的特性。

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