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Glass Polarization Induced Drift of a Closed-Loop Micro-Accelerometer

机译:玻璃偏振引起的闭环微加速度计的漂移

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摘要

The glass polarization effects were introduced in this paper to study the main cause of turn-on drift phenomenon of closed-loop micro-accelerometers. The glass substrate underneath the sensitive silicon structure underwent a polarizing process when the DC bias voltage was applied. The slow polarizing process induced an additional electrostatic field to continually drag the movable mass block from one position to another so that the sensing capacitance was changed, which led to an output drift of micro-accelerometers. This drift was indirectly tested by experiments and could be sharply reduced by a shielding layer deposited on the glass substrate because the extra electrical filed was prohibited from generating extra electrostatic forces on the movable fingers of the mass block. The experimental results indicate the average magnitude of drift decreased about 73%, from 3.69 to 0.99 mV. The conclusions proposed in this paper showed a meaningful guideline to improve the stability of micro-devices based on silicon-on-glass structures.
机译:本文介绍了玻璃偏振效应,以研究闭环微加速度计的导通漂移现象的主要原因。当施加直流偏置电压时,位于敏感硅结构下方的玻璃基板经过了极化处理。缓慢的极化过程产生了一个额外的静电场,将可移动质量块从一个位置连续拖到另一个位置,从而改变了感测电容,这导致了微加速度计的输出漂移。该漂移是通过实验间接测试的,并且可以通过沉积在玻璃基板上的屏蔽层来大幅降低,因为禁止了多余的电场在质量块的可移动指状物上产生额外的静电力。实验结果表明,平均漂移幅度从3.69降至0.99 mV降低了约73%。本文提出的结论为提高基于玻璃硅结构的微器件的稳定性提供了有意义的指导。

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